Journal article
Simulation in elemental mapping using aberration-corrected electron microscopy
LJ Allen
Ultramicroscopy | ELSEVIER SCIENCE BV | Published : 2017
Abstract
Elemental mapping at the atomic scale in aberration-corrected electron microscopes is becoming increasingly widely used. In this paper we describe the essential role of simulation in understanding the underlying physics and thus in correctly interpreting these maps, both qualitatively and quantitatively.
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Grants
Awarded by Australian Research Council
Funding Acknowledgements
This research was supported under the Australian Research Councils Discovery Projects funding scheme (Project DP110102228). The author acknowledges the important contribution of collaborators and colleagues in the electron microscopy community to this work. In particular, the substantial contributions of the following colleagues in Melbourne to the work described here is acknowledged: Adrian D'Alfonso, Zhen Chen, Eireann Cosgriff, Christian Dwyer, Scott Findlay, Ben Forbes, Torgny josefsson, Nathan Lugg, Andrew Martin, Melissa Neish, Mark Oxley, Chris Rossouw, Gary Ruben, Matt Weyland and Chris Witte.